SEM (Scanning Electron Microscope) is a type of electron microscope that focuses a beam of electrons onto the surface of a sample to obtain an image from that surface. Electrons interact with the atoms of the sample, producing various signals. The detection of these signals provides information about the surface topography and composition of the sample.

The device includes an EDX (Energy Dispersive X-ray Spectrometer) detector that provides atomic percentages of elements in the sample. Mapping studies are also conducted.
 

Working Principle:

TEM (Transmission Electron Microscope) is based on the principle of imaging high-energy electrons passing through a very thin sample. This technique allows for obtaining morphological, structural, and elemental information at various magnifications, ranging from low to high.

The device includes an EDX (Energy Dispersive X-ray Spectrometer) detector that provides atomic percentages of elements in the sample.

Atomic Force Microscope (AFM) obtains three-dimensional topographic images of material surfaces by scanning the surface with a fine tip (cantilever). It is used to acquire various surface properties (surface morphology and roughness, etc.) of samples such as thin films, ceramics, metals, polymers, semiconductors, and biomaterials.

AFM can be used in two different modes: the contact mode, where the tip makes contact with the surface, and the non-contact mode, where the tip does not touch the surface.

It can also work in conjunction with Raman Spectroscopy, allowing for spectrum collection from the same region.